| 字段 | 字段内容 |
|---|---|
| 02 | |
| 001 | 02a0009273 |
| 005 | 20010629105548.7 |
| 008 | $0: 10629s1984 wb a b 00110 eng |
| 010 | $a: 88035563 |
| 020 | $a: 3540117946 :$c: CNY4.80 |
| 035 | $a: W134253-4 |
| 041 | $a: eng |
| 050 | $a: QH212.T7$b: R43 1989 |
| 082 | $a: 502/.8/25$2: 19 |
| 093 | $a: TN153 |
| 099 | $a: CAL 022000177124 |
| 100 | $a: Reimer, Ludwig$d: 1928- |
| 245 | $1: 0$a: Transmission electron microscopy :$b: physics of image formation and microanalysis /$c: Ludwig Reimer. |
| 260 | $a: Berlin :$b: Springer-Verlag,$c: c1984. |
| 300 | $a: xiii, 521 p. :$b: ill. ;$c: 24 cm. |
| 440 | $a: Springer series in optical sciences; $v: v. 36 |
| 500 | $a: includes bibliographical references and index |
| 650 | $a: Electron microscope, Transmission. |
| 851 | $a: ENG$b: BUCTL$c: 20050915 |
| 905 | $a: BUCTL$p: W134253-4$r: CNY4.80$d: TN153$e: 8703 |
| 999 | $a: zw$b: 2$c: E$e: wh01 |
北京创讯未来软件技术有限公司 版权所有 ALL RIGHTS RESERVED 京ICP备 09032139
欢迎第42970402位用户访问本系统